Showing 1 - 5 of 5 Results
1.
High Resolution X-Ray Diffraction and Topography by Bowen, D. Keith, Tanner, B. K. ISBN: 9780850667585 List Price: $119.95
2.
Characterization of Crystal Growth Defects by X-Ray Methods (Applications of Communications ... by Tanner, Brian K., Bowen, D.... ISBN: 9780306406287 List Price: $110.00
4.
X-Ray Metrology in Semiconductor Manufacturing by Bowen, D. Keith, Tanner, Br... ISBN: 9781420005653